Small & Vorgan :: Meet Your iBrain (2008)

  • published in a October/November 2008 issue of popularisation review Scientific American Mind

  • mentions the fMRI study (c.f. next slide), but only in the state where 3 Net Naive volunteers were recruited (c.f. page 45)

  • quite techno-pessimist terminology: "continuous partial attention", "heightened state of stress", "a sense of constant crisis", "digital fog" (p. 47), "techno-brain burn-out is threating to become an epidemic", "impair cognition, lead to depression ..." (p.48)

  • little bit of techno-optimism at the end: "technological experiences sharpen some cognitive abilities" (p. 49)

  • summing up: "all of us... will master new technologies and take advantage of their efficiencies, but we need to maintain our people skills and our humanity"

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